microstructure scanning electron microscopy Search Results


98
JEOL surface morphology
Surface Morphology, supplied by JEOL, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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SCHOTT viscosimeter serie l, schott, ref. 28.541.120, l2 stem
Viscosimeter Serie L, Schott, Ref. 28.541.120, L2 Stem, supplied by SCHOTT, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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GlobalStem mef feeder
Mef Feeder, supplied by GlobalStem, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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SolidWorks Corp three-dimensional assembly femoral stem iso 7206
Three Dimensional Assembly Femoral Stem Iso 7206, supplied by SolidWorks Corp, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Integrated Graphene ultrafast scanning electron microscope (sem) based on the optical fiber-integrated graphene ultrafast hot-electron source
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Ultrafast Scanning Electron Microscope (Sem) Based On The Optical Fiber Integrated Graphene Ultrafast Hot Electron Source, supplied by Integrated Graphene, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 90 stars, based on 1 article reviews
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90
Ohta s Isan Co Ltd scanning electron microscopy
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscopy, supplied by Ohta s Isan Co Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 90 stars, based on 1 article reviews
scanning electron microscopy - by Bioz Stars, 2026-06
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90
Raith GmbH field emission gun scanning electron microscope leo 1530
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Field Emission Gun Scanning Electron Microscope Leo 1530, supplied by Raith GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 90 stars, based on 1 article reviews
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90
Rigaku Corporation txa-840a scanning electron microscope (sem)
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Txa 840a Scanning Electron Microscope (Sem), supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/txa-840a scanning electron microscope (sem)/product/Rigaku Corporation
Average 90 stars, based on 1 article reviews
txa-840a scanning electron microscope (sem) - by Bioz Stars, 2026-06
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99
JEOL additional haadf stem images
Figure 4. <t>HAADF-STEM</t> image of 0.05 wt% Ir on MgO1073. The MgO exposes the
Additional Haadf Stem Images, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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97
JEOL microscopy om
Figure 4. <t>HAADF-STEM</t> image of 0.05 wt% Ir on MgO1073. The MgO exposes the
Microscopy Om, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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96
JEOL electron microscopy
Figure 4. <t>HAADF-STEM</t> image of 0.05 wt% Ir on MgO1073. The MgO exposes the
Electron Microscopy, supplied by JEOL, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 96 stars, based on 1 article reviews
electron microscopy - by Bioz Stars, 2026-06
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97
JEOL jsm 7001f field emission scanning electron microscope
Figure 4. <t>HAADF-STEM</t> image of 0.05 wt% Ir on MgO1073. The MgO exposes the
Jsm 7001f Field Emission Scanning Electron Microscope, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


a Schematic diagram of our ultrafast SEM. A traditional scanning microscope body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.

Journal: Nature Communications

Article Title: Stable ultrafast graphene hot-electron source on optical fiber

doi: 10.1038/s41467-025-60915-x

Figure Lengend Snippet: a Schematic diagram of our ultrafast SEM. A traditional scanning microscope body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.

Article Snippet: Fig. 4 Ultrafast scanning electron microscope (SEM) based on the optical fiber-integrated graphene ultrafast hot-electron source. a Schematic diagram of our ultrafast SEM.

Techniques: Microscopy, Imaging

Figure 4. HAADF-STEM image of 0.05 wt% Ir on MgO1073. The MgO exposes the

Journal: The Journal of Physical Chemistry C

Article Title: Iridium Atoms Bonded to Crystalline Powder MgO: Characterization by Imaging and Spectroscopy

doi: 10.1021/acs.jpcc.9b08592

Figure Lengend Snippet: Figure 4. HAADF-STEM image of 0.05 wt% Ir on MgO1073. The MgO exposes the

Article Snippet: Additional HAADF STEM images were recorded at the University of California, Davis, with a JEOL JEM-2100F instrument operated at 200 kV; it was equipped with a CEOS hexapole probe aberration corrector and a field emission gun.

Techniques:

Figure 5. HAADF-STEM image of 0.1 wt% Ir on MgO1073. MgO is in the (100)

Journal: The Journal of Physical Chemistry C

Article Title: Iridium Atoms Bonded to Crystalline Powder MgO: Characterization by Imaging and Spectroscopy

doi: 10.1021/acs.jpcc.9b08592

Figure Lengend Snippet: Figure 5. HAADF-STEM image of 0.1 wt% Ir on MgO1073. MgO is in the (100)

Article Snippet: Additional HAADF STEM images were recorded at the University of California, Davis, with a JEOL JEM-2100F instrument operated at 200 kV; it was equipped with a CEOS hexapole probe aberration corrector and a field emission gun.

Techniques:

Figure 6. HAADF-STEM image of 1 wt% Ir on MgO1073. MgO is in the (111)

Journal: The Journal of Physical Chemistry C

Article Title: Iridium Atoms Bonded to Crystalline Powder MgO: Characterization by Imaging and Spectroscopy

doi: 10.1021/acs.jpcc.9b08592

Figure Lengend Snippet: Figure 6. HAADF-STEM image of 1 wt% Ir on MgO1073. MgO is in the (111)

Article Snippet: Additional HAADF STEM images were recorded at the University of California, Davis, with a JEOL JEM-2100F instrument operated at 200 kV; it was equipped with a CEOS hexapole probe aberration corrector and a field emission gun.

Techniques:

Figure 7. HAADF-STEM image of 0.05 wt% Ir on MgO1273. The image shows clear

Journal: The Journal of Physical Chemistry C

Article Title: Iridium Atoms Bonded to Crystalline Powder MgO: Characterization by Imaging and Spectroscopy

doi: 10.1021/acs.jpcc.9b08592

Figure Lengend Snippet: Figure 7. HAADF-STEM image of 0.05 wt% Ir on MgO1273. The image shows clear

Article Snippet: Additional HAADF STEM images were recorded at the University of California, Davis, with a JEOL JEM-2100F instrument operated at 200 kV; it was equipped with a CEOS hexapole probe aberration corrector and a field emission gun.

Techniques:

Figure 8. HAADF-STEM image of 0.1 wt% Ir on MgO1273, with the MgO in an

Journal: The Journal of Physical Chemistry C

Article Title: Iridium Atoms Bonded to Crystalline Powder MgO: Characterization by Imaging and Spectroscopy

doi: 10.1021/acs.jpcc.9b08592

Figure Lengend Snippet: Figure 8. HAADF-STEM image of 0.1 wt% Ir on MgO1273, with the MgO in an

Article Snippet: Additional HAADF STEM images were recorded at the University of California, Davis, with a JEOL JEM-2100F instrument operated at 200 kV; it was equipped with a CEOS hexapole probe aberration corrector and a field emission gun.

Techniques:

Figure 9. Representative HAADF-STEM image of sample containing 0.1 wt% Ir

Journal: The Journal of Physical Chemistry C

Article Title: Iridium Atoms Bonded to Crystalline Powder MgO: Characterization by Imaging and Spectroscopy

doi: 10.1021/acs.jpcc.9b08592

Figure Lengend Snippet: Figure 9. Representative HAADF-STEM image of sample containing 0.1 wt% Ir

Article Snippet: Additional HAADF STEM images were recorded at the University of California, Davis, with a JEOL JEM-2100F instrument operated at 200 kV; it was equipped with a CEOS hexapole probe aberration corrector and a field emission gun.

Techniques:

Figure 10. Representative HAADF-STEM image of sample containing 0.1 wt%

Journal: The Journal of Physical Chemistry C

Article Title: Iridium Atoms Bonded to Crystalline Powder MgO: Characterization by Imaging and Spectroscopy

doi: 10.1021/acs.jpcc.9b08592

Figure Lengend Snippet: Figure 10. Representative HAADF-STEM image of sample containing 0.1 wt%

Article Snippet: Additional HAADF STEM images were recorded at the University of California, Davis, with a JEOL JEM-2100F instrument operated at 200 kV; it was equipped with a CEOS hexapole probe aberration corrector and a field emission gun.

Techniques:

Figure 12. (A) HAADF-STEM images of (A) MgO-supported sample containing 0.05

Journal: The Journal of Physical Chemistry C

Article Title: Iridium Atoms Bonded to Crystalline Powder MgO: Characterization by Imaging and Spectroscopy

doi: 10.1021/acs.jpcc.9b08592

Figure Lengend Snippet: Figure 12. (A) HAADF-STEM images of (A) MgO-supported sample containing 0.05

Article Snippet: Additional HAADF STEM images were recorded at the University of California, Davis, with a JEOL JEM-2100F instrument operated at 200 kV; it was equipped with a CEOS hexapole probe aberration corrector and a field emission gun.

Techniques:

Figure 13. HAADF-STEM images of 0.01 wt% Ir, Ir(C2H4)2 on MgO1073, exposing the

Journal: The Journal of Physical Chemistry C

Article Title: Iridium Atoms Bonded to Crystalline Powder MgO: Characterization by Imaging and Spectroscopy

doi: 10.1021/acs.jpcc.9b08592

Figure Lengend Snippet: Figure 13. HAADF-STEM images of 0.01 wt% Ir, Ir(C2H4)2 on MgO1073, exposing the

Article Snippet: Additional HAADF STEM images were recorded at the University of California, Davis, with a JEOL JEM-2100F instrument operated at 200 kV; it was equipped with a CEOS hexapole probe aberration corrector and a field emission gun.

Techniques: